Section R12-1-802. Definitions

“Analytical x-ray equipment” means devices or machines used for x-ray diffraction or x-ray induced fluorescence analysis.

“Analytical x-ray system” means a group of components uti- lizing x-rays to determine the elemental composition or to examine the microstructure of materials.

“Enclosed beam x-ray system” means an analytical x-ray sys- tem constructed in such a way that access to the interior of the enclosure housing the x-ray source is precluded during opera- tion except through bypassing of interlocks or other safety devices to perform maintenance or servicing.

“Fail-safe characteristic” means a design feature which causes beam port shutters to close, or otherwise prevents emergence of the primary beam, upon the failure of a safety or warning device.

“Local component” means part of an analytical x-ray system and includes each area that is struck by x-rays, such as radia- tion source housings, port and shutter assemblies, collimators, sample holders, cameras, goniometers, detectors and shield- ing, but does not include power supplies, transformers, ampli- fiers, readout devices, and control panels.

“Normal operating procedures” means instructions or proce- dures including, but not limited to, sample insertion and manipulation, equipment alignment, routine maintenance by the registrant, and data recording procedures which are related to radiation safety.

“Open beam x-ray system” means an analytical x-ray system which permits an individual to place some body part in the pri- mary beam path during normal operation.

“Primary beam” means radiation which passes through an aperture of the source housing on a direct path from the x-ray tube.

Historical Note

Former Rule Section H.2; Former Section R12-1-802 repealed, new Section R12-1-802 adopted effective June 30, 1977 (Supp. 77-3). Amended effective Aug. 8, 1986 (Supp. 86-4). Amended by final rulemaking at 5 A.A.R.

1817, effective May 12, 1999 (Supp. 99-2).